Triennial Report 2015 - 2017 - Metrology Research Institute

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorKärhä, Petri, Editor
dc.contributor.departmentSignaalinkäsittelyn ja akustiikan laitosfi
dc.contributor.departmentDepartment of Signal Processing and Acousticsen
dc.contributor.labMetrology Research Instituteen
dc.contributor.schoolSähkötekniikan korkeakoulufi
dc.contributor.schoolSchool of Electrical Engineeringen
dc.date.accessioned2018-11-05T13:10:30Z
dc.date.available2018-11-05T13:10:30Z
dc.date.issued2018
dc.description.abstractThis triennial report summarizes the research carried out at the Metrology Research Institute of Aalto University during period 2015 - 2017. Close collaboration between the Institute and MIKES Metrology of VTT Technical Research Centre of Finland Ltd has continued after the merge of MIKES to VTT in the beginning of 2015, leading to many research highlights. An article on “Advantages of white LED lamps and new detector technology in photometry” by Pulli et al was published in Light: Science and Application (4, e332, 2015), a journal with high impact factor of 14.6. Another highlight of 2016 was the start and excellent results of the European PhotoLED project (Future photometry based on solid state lighting products), coordinated by Tuomas Poikonen at VTT and Aalto University. Finally, several oral contributions in top-class international conferences were achieved by researchers of the Institute: One invited talk and four oral contributions in the NEWRAD Conference (Tokyo 2017) and five oral contributions in the CIE Conference (Korea 2017).en
dc.format.extent38
dc.format.mimetypeapplication/pdfen
dc.identifier.isbn978-952-60-8260-8 (electronic)
dc.identifier.issn1799-490X (electronic)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/34553
dc.identifier.urnURN:ISBN:978-952-60-8260-8
dc.language.isoenen
dc.publisherAalto Universityen
dc.publisherAalto-yliopistofi
dc.relation.ispartofseriesAalto University publication series SCIENCE + TECHNOLOGYen
dc.relation.ispartofseries5/2018
dc.subject.keywordMetrology Research Instituteen
dc.subject.keywordMIKESen
dc.subject.keywordNational Standards Laboratoryen
dc.subject.keywordphotometryen
dc.subject.keywordradiometryen
dc.subject.keywordspectrophotometryen
dc.subject.keywordmeasurement technologyen
dc.subject.otherPhysicsen
dc.subject.otherElectrical engineeringen
dc.titleTriennial Report 2015 - 2017 - Metrology Research Instituteen
dc.typeD4 Julkaistu kehittämis- tai tutkimusraportti tai -selvitysfi
dc.type.dcmitypetexten

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